Analytical Suite Metadata
GSC electron microprobe-Low-Cr Diopside Analysis
GSC electron microprobe Low-Cr Diopside analysis. Grains are analysed for 13 major and minor element oxides.
Mineral analyses were acquired on a Cameca SX-50 microprobe fitted with 4 wavelength-dispersive spectrometers, with a take-off angle of 40 degrees. The operating conditions were 20kV accelerating voltage and 10nA current, using a focused beam. Count times were 10 seconds on peak and 5 seconds off-peak. A ZAF matrix correction program of Armstrong (1988) was used to process the raw data. Reference standards used were a mixture of natural and synthetic pure metals, simple oxides and simple compounds.
A variable number of oxides were measured:
SiO2, TiO2, Al2O3, Cr2O3, FeO, MnO, NiO, MgO, CaO, BaO, Na2O, K2O, V2O3
Description taken from Open File 5692.
Armstrong, J.T. (1988). Quantitative analysis of silicates and oxide minerals: Comparison of Monte-Carlo, ZAF and Phi-Rho-Z procedures. Microbeam Analysis, p 239-246.
Sample material: solid
Sample weight: unstated
|Index||Method Order||Method ID||Quantity||Detection Limit|
Associated Analytical Packages:
|Index||Package ID||Package Name|
|1||234||GSC electron microprobe laboratory (13 oxides)|
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