Analytical Suite Metadata

INRS XRF (1)

…

General Methodology:

XRF trace element analyses were performed on 32 mm diameter discs.  The discs were prepared by mixing 4 g of the sample (< 0.063 mm) with 1g of the ligen (SX) and agitating this mixture for 10 minutes.  Applying a pressure of 40 tons for 2 minute made the discs.  Analyses were corrected using the Compton method.

[description taken from GSC Open File 2246, p12]

Instrument: unstated

Sample material: solid

Sample weight: 4000 milligrams

Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence

Children

WD-XRF | ED-XRF | pXRF

Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None

Analytical Methods:

Index Method Order Method ID Quantity Detection Limit
1  1  3047     Ba_XRF   50
2  2  3048     Co_XRF   2
3  3  3049     Cr_XRF   4
4  4  3050     Cu_XRF   4
5  5  3051     Ga_XRF   2
6  6  3052     Nb_XRF   2
7  7  3053     Ni_XRF   3
8  8  3054     Pb_XRF   5
9  9  3055     Rb_XRF   3
10  10  3056     Sr_XRF   3
11  11  3057     V_XRF   5
12  12  3058     Y_XRF   4
13  13  3059     Zn_XRF   5
14  14  3060     Zr_XRF   3

Associated Analytical Packages:

Index Package ID Package Name
1  11     INRS XRF + INAA (low detection limits)
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