Analytical Method Metadata

SiO2 - WD-XRF - NONE



Attribute Value
Quantity: Silicon dioxide
Units: percent
Description:
Determination Limit: 0.01  percent
Upper Determination Limit:
Analytical Precision:
Analytical Grouping: SiO2 | NONE | WD-XRF

Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence >> WD-XRF

Children

None


Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None


Associated Analytical Suites:

Index Suite ID Suite Name
1  617     Geoscience Labs, (OGS) MRD123 Lithogeochemical Database: wavelength-dispersive XRF of fused glass disks
Date modified: