Analytical Method Metadata
SiO2 - WD-XRF - NONE
| Attribute | Value |
|---|---|
| Quantity: | Silicon dioxide |
| Units: | percent |
| Description: | |
| Determination Limit: | 0.01 percent |
| Upper Determination Limit: | |
| Analytical Precision: | |
| Analytical Grouping: | SiO2 | NONE | WD-XRF |
Analytical Technique:
Hierarchical classification
Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence >> WD-XRF
Children
None
Analytical Decomposition:
Hierarchical classification
Children
None
Associated Analytical Suites:
| Index | Suite ID | Suite Name |
|---|---|---|
| 1 | 617 | Geoscience Labs, (OGS) MRD123 Lithogeochemical Database: wavelength-dispersive XRF of fused glass disks |
- Date modified: