Analytical Method Metadata
SiO2 - XRAY_FLUOR - NONE
| Attribute | Value |
|---|---|
| Quantity: | Silicon dioxide |
| Units: | percent |
| Description: | |
| Determination Limit: | 0.01 percent |
| Upper Determination Limit: | 99.99 percent |
| Analytical Precision: | |
| Analytical Grouping: | SiO2 | NONE | XRAY_FLUOR |
Analytical Technique:
Hierarchical classification
Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence
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Analytical Decomposition:
Hierarchical classification
Children
None
Associated Analytical Suites:
| Index | Suite ID | Suite Name |
|---|---|---|
| 1 | 321 | OGS Geoscience Laboratories, suite XRF-M01 |
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