Analytical Suite Metadata

XRAL XRF Bi + Sn



X-ray fluorescence analysis of Bi and Sn was performed on the till fractions.  These analyses were done by X-Ray Assay Laboratories (XRAL) in Toronto, Ontario.

Bi detection limit: 3 ppm

Sn detection limit: 2 ppm

General Methodology:

unstated

Instrument: unstated

Sample material: solid

Sample weight: unstated


Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence

Children

WD-XRF | ED-XRF | pXRF


Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None


Analytical Methods:

IndexMethod OrderMethod IDQuantityDetection Limit
1  3174     Bi_XRF  3
2  3175     Sn_XRF  2

Associated Analytical Packages:

IndexPackage IDPackage Name
1  16     XRAL INA + Hg CV-AAS + XRF
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