Analytical Suite Metadata
INRS XRF (2)
X-ray fluorescence analysis of 14 trace elements was performed on the prepared samples. These analyses were done by laboratories at the Institut national de la recherche scientifique - Géoressources (INRS), Sainte-Foy, Quebec.
Distinguishing characteristic : 15 minutes agitation
XRF trace element analyses were performed on 32 mm diameter discs. The discs were prepared by mixing 4 g of the sample (< 0.063 mm) with 1g of the ligen (SX) and agitating this mixture for 15 minutes. Applying a pressure of 40 tons for 1 minute made the discs. Analyses were corrected using the Compton method. The counting times were 40 seconds on the "picks" and background and 20 seconds on the interferences. The "detection limits" are calculated at 2σ level and measurement error for concentrations greater than 10 times the detection limit is: ± detection limit + 5% of the measured value.
Sample material: solid
Sample weight: unstated
|Index||Method Order||Method ID||Quantity||Detection Limit|
Associated Analytical Packages:
|Index||Package ID||Package Name|
|1||12||INRS XRF + INAA (high detection limits)|
- Date modified: