Analytical Suite Metadata

INRS XRF (2)



X-ray fluorescence analysis of 14 trace elements was performed on the prepared samples.  These analyses were done by laboratories at the Institut national de la recherche scientifique - Géoressources (INRS), Sainte-Foy, Quebec.

Distinguishing characteristic : 15 minutes agitation

General Methodology:

XRF trace element analyses were performed on 32 mm diameter discs.  The discs were prepared by mixing 4 g of the sample (< 0.063 mm) with 1g of the ligen (SX) and agitating this mixture for 15 minutes.  Applying a pressure of 40 tons for 1 minute made the discs.  Analyses were corrected using the Compton method.  The counting times were 40 seconds on the "picks" and background and 20 seconds on the interferences.  The "detection limits" are calculated at 2σ  level and measurement error for concentrations greater than 10 times the detection limit is: ± detection limit + 5% of the measured value.

Instrument: unstated

Sample material: solid

Sample weight: unstated


Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence

Children

WD-XRF | ED-XRF | pXRF


Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None


Analytical Methods:

IndexMethod OrderMethod IDQuantityDetection Limit
1  3061     Ba_XRF  50
2  3062     Co_XRF  2
3  3063     Cr_XRF  4
4  3064     Cu_XRF  4
5  3065     Ga_XRF  2
6  3066     Nb_XRF  2
7  3067     Ni_XRF  3
8  3068     Pb_XRF  5
9  3069     Rb_XRF  3
10  10  3070     Sr_XRF  3
11  11  3071     V_XRF  5
12  12  3072     Y_XRF  4
13  13  3073     Zn_XRF  5
14  14  3074     Zr_XRF  3

Associated Analytical Packages:

IndexPackage IDPackage Name
1  12     INRS XRF + INAA (high detection limits)
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