Analytical Suite Metadata

INRS XRF (1)



X-ray fluorescence analysis of 14 trace elements was performed on the prepared samples.  These analyses were done by laboratories at the Institut national de la recherche scientifique - Géoressources (INRS), Sainte-Foy, Quebec.

Distinguishing characteristic : 10 minutes agitation

General Methodology:

XRF trace element analyses were performed on 32 mm diameter discs.  The discs were prepared by mixing 4 g of the sample (< 0.063 mm) with 1g of the ligen (SX) and agitating this mixture for 10 minutes.  Applying a pressure of 40 tons for 2 minute made the discs.  Analyses were corrected using the Compton method.

[description taken from GSC Open File 2246, p12]

Instrument: unstated

Sample material: solid

Sample weight: unstated


Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence

Children

WD-XRF | ED-XRF | pXRF


Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None


Analytical Methods:

IndexMethod OrderMethod IDQuantityDetection Limit
1  3047     Ba_XRF  50
2  3048     Co_XRF  2
3  3049     Cr_XRF  4
4  3050     Cu_XRF  4
5  3051     Ga_XRF  2
6  3052     Nb_XRF  2
7  3053     Ni_XRF  3
8  3054     Pb_XRF  5
9  3055     Rb_XRF  3
10  10  3056     Sr_XRF  3
11  11  3057     V_XRF  5
12  12  3058     Y_XRF  4
13  13  3059     Zn_XRF  5
14  14  3060     Zr_XRF  3

Associated Analytical Packages:

IndexPackage IDPackage Name
1  11     INRS XRF + INAA (low detection limits)
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