Analytical Suite Metadata
INRS XRF (1)
X-ray fluorescence analysis of 14 trace elements was performed on the prepared samples. These analyses were done by laboratories at the Institut national de la recherche scientifique - Géoressources (INRS), Sainte-Foy, Quebec.
Distinguishing characteristic : 10 minutes agitation
XRF trace element analyses were performed on 32 mm diameter discs. The discs were prepared by mixing 4 g of the sample (< 0.063 mm) with 1g of the ligen (SX) and agitating this mixture for 10 minutes. Applying a pressure of 40 tons for 2 minute made the discs. Analyses were corrected using the Compton method.
[description taken from GSC Open File 2246, p12]
Sample material: solid
Sample weight: unstated
|Index||Method Order||Method ID||Quantity||Detection Limit|
Associated Analytical Packages:
|Index||Package ID||Package Name|
|1||11||INRS XRF + INAA (low detection limits)|
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