Analytical Suite Metadata

Bondar-Clegg/TSD 2 micron XRF



Sn by XRF

General Methodology:

unstated

Instrument: unstated

Sample material: solid

Sample weight: unstated


Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence

Children

WD-XRF | ED-XRF | pXRF


Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None


Analytical Methods:

IndexMethod OrderMethod IDQuantityDetection Limit
1  3016     Sn_XRF  1

Associated Analytical Packages:

IndexPackage IDPackage Name
1  7     Bondar Clegg / TSD 2 micron (1)
2  25     Bondar Clegg / TSD 2 micron (2)
3  29     Bondar Clegg / TSD 2 micron (3)
Date modified: