Analytical Method Metadata

SiO2 - XRAY_FLUOR - NONE



AttributeValue
Quantity: Silicon dioxide
Units: percent
Description:
Determination Limit:0.01  percent
Upper Determination Limit:99.99  percent
Analytical Precision:
Analytical Grouping:SiO2 | NONE | XRAY_FLUOR

Analytical Technique:

Hierarchical classification

Technique >> Spectroscopy >> Electromagnetic radiation >> X-ray >> Luminescence >> Fluorescence

Children

WD-XRF | ED-XRF | pXRF


Analytical Decomposition:

Hierarchical classification

Decomposition >> None

Children

None


Associated Analytical Suites:

IndexSuite IDSuite Name
1  321     OGS Geoscience Laboratories, suite XRF-M01
Date modified: